Integrated Photonics Test: Passive Devices
Instructors: Professor JeuJun Hu, MIT and Professor Jaime Cardenas, University of Rochester
Duration: 3 weeks
Format: Self-paced
Prof. Hu (MIT) reviews test characterization methods for passive integrated photonics components, including fiber-to-chip coupling schemes, waveguides, spirals, Mach Zehnder Interferometers, Y-splitters, ring resonators, and directional couplers. Waveguide characterization will focus on loss and dispersion measurements, and examine wavelength and polarization dependencies. Prof. Jaime Cardenas (U of Rochester) will offer his expertise in Design for Manufacturing (DfM) and testing at a wafer-scale.